publications

2024

  1. Usformer_challenge_dataset.gif
    Usformer: A small network for left atrium segmentation of 3D LGE MRI
    Hui Lin, Santiago López-Tapia, Florian Schiffers, and 8 more authors
    Heliyon, 2024
  2. certificate_justraigs.gif
    Brighteye: Glaucoma Screening with Color Fundus Photographs based on Vision Transformer
    Hui Lin, Charilaos Apostolidis, and Aggelos K Katsaggelos
    arXiv preprint arXiv:2405.00857, 2024

2023

  1. J. Intell. Manuf.
    A deep learning framework for layer-wise porosity prediction in metal powder bed fusion using thermal signatures
    Hui Lin, Yuwei Mao, Christina Xuan Yu, and 8 more authors
    Journal of Intelligent Manufacturing, 2023
  2. MICAAI Chall.
    YOLO-Angio: An Algorithm for Coronary Anatomy Segmentation
    Hui Lin, Tom Liu, Aggelos K Katsaggelos, and 1 more author
    arXiv preprint arXiv:2310.15898, 2023
  3. MICAAI Chall.
    StenUNet: Automatic Stenosis Detection from X-ray Coronary Angiography
    Hui Lin, Tom Liu, Aggelos Katsaggelos, and 1 more author
    arXiv preprint arXiv:2310.14961, 2023
  4. Usformer: A Light Neural Network for Left Atrium Segmentation of 3D LGE MRI
    Hui Lin, Santiago Lopez Tapia, Florian Schiffers, and 8 more authors
    2023
  5. Sustainability assessment and pathways for US domestic paper recycling
    Enze Jin, Stijn Ewijk, Koichi S Kanaoka, and 7 more authors
    Resources, Conservation and Recycling, 2023

2021

  1. Physical mechanisms in hybrid additive manufacturing: A process design framework
    Samantha Webster, Hui Lin, Fred M Carter III, and 2 more authors
    Journal of Materials Processing Technology, 2021
  2. Geometry-agnostic data-driven thermal modeling of additive manufacturing processes using graph neural networks
    Mojtaba Mozaffar, Shuheng Liao, Hui Lin, and 2 more authors
    Additive Manufacturing, 2021
  3. Quality safety monitoring of LED chips using deep learning-based vision inspection methods
    Yufeng Shu, Bin Li, and Hui Lin
    Measurement, 2021

2020

  1. IEEE TASE
    Defect image sample generation with GAN for improving defect recognition
    Shuanlong Niu, Bin Li, Xinggang Wang, and 1 more author
    IEEE Transactions on Automation Science and Engineering, 2020

2019

  1. J. Intell. Manuf.
    Automated defect inspection of LED chip using deep convolutional neural network
    Hui Lin, Bin Li, Xinggang Wang, and 2 more authors
    Journal of Intelligent Manufacturing, 2019
  2. DefectGAN: Weakly-Supervised Defect Detection using Generative Adversarial Network
    Hui Lin, Shuanlong Niu, Tongzhi Niu, and 2 more authors
    2019