Hui Lin (林惠)

2479 E Bayshore Rd
Palo Alto, CA 94303
#Senior Research Scientist at OPPO
Ph.D. at the iVPL lab at Northwestern University, supervised by Prof. Aggelos Katsaggelos and Prof. Daniel Kim. My research focuses on deep learning and computer vision -based classification, detection, segmentation, and generation in manufacturing and medical imaging.
My first two years were spent studying automatic defect detection and thermal prediction during additive manufacturing; then, I worked on segmentation and unsupervised domain adaptation in MRI, CT, OCT, X-ray, etc. I am proficient in RNN, GRU, GNN, GAN, Transformer, etc.
Previously, I obtained a master’s degree in Mechanical Engineering from Huazhong University of Science and Technology (HUST) in 2019, supervised by Prof. Bin Li and Prof. Xinggang Wang. I received a Bachelor’s degree in Materials Processing and Control Engineering from Qiming College, HUST, in 2016.
news
May 1, 2025 | I am starting a full-time position at the OPPO US Research Center, focusing on wrist PPG analysis for reliable hypertension risk screening. |
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Feb 24, 2025 | I am currently working as a Machine Learning Engineer intern at the OPPO US Research Center, contributing to the design of recommendation systems. |
Dec 20, 2024 | My work ( paper ) during the summer internship 2025 on analyzing wrist-collected PPG data for continuous hypertension risk screening has been accepted for presentation at ICASSP 2025 ! 🎉 Stay tuned for more updates! |
Oct 31, 2024 | Our work on the FLARE 2024 Task3 at MICCAI 2024 was ranked 5th regarding the accuracy. |
Sep 15, 2024 | Our work on the Track MyoPS++ CARE 2024 Challenge at MICCAI 2024 titled GenSegNet: Leveraging Synthetic Sequences and Pseudo Labels for Multi-Sequence Myocardial Pathology Segmentation, has been submitted. |
selected publications
2025
- ICASSPLongitudinal Wrist PPG Analysis for Reliable Hypertension Risk Screening Using Deep LearningICASSP 2025, 2025
2024
2023
- MICAAI Chall.StenUNet: Automatic Stenosis Detection from X-ray Coronary AngiographyarXiv preprint arXiv:2310.14961, 2023
2020
- IEEE TASEDefect image sample generation with GAN for improving defect recognitionIEEE Transactions on Automation Science and Engineering, 2020
2019
- J. Intell. Manuf.Automated defect inspection of LED chip using deep convolutional neural networkJournal of Intelligent Manufacturing, 2019